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Event Detail

Event Type Conference

3rd International Conference on Condition Assessment Techniques in Electrical Systems

Event Serial-42560
Contact Person- Prof. C.C.Reddy
Event enquiries email address-
Deadline for abstracts/proposals: 2017-06-15
Organized by: IEEE
Venue: ropar,  punjab,  India

About Event

3rd CATCON 2017 [IEEE Conference ref. No. 41724] is technically cosponsored by IEEE Dielectrics and Electrical Insulation Society (DEIS), IEEE Delhi Section and DEIS Chapter of IEEE Kolkata Section and is organized by Electrical Department of IIT Ropar. (punjab)

Event Promotions

27th Sep 2018 ,Pune , India

The conferences focus on three domains of Smart Systems i.e. Computing, Mobility and Intelligent Systems, and healthcare. The seismic shift towards intelligent systems have radicalized and poised the human-life to witness a dynamic future. While envisioning these changes Bertrand Russell and Isaac Asimov predicted in the last century the surge of creativity of human spirits so as to lead a life of eternal youth with unbelievably less hassles in mundane life. This conference brings together the global thought leaders and innovators to discuss real-world issues, tackle intricate problems and find novel enabling solutions by synthesizing the concept of smart systems and technologies.
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